Fig. 4

Analysis of integrity of selected brands of coveralls and N-95 masks following multiple cycles of VHP exposure by scanning electron microscopy. a Representative SEM photomicrograph of a brand of coverall at 200X and 1000X magnification pre- and post-multiple cycles of VHP exposure. b Comparison of fibre width of selected brand of coverall, before and after VHP exposure. c Representative SEM photomicrograph of a brand of N-95 mask outer layer at 200X and 1000X magnification pre- and post-5 cycles of VHP exposure. d Comparison of fiber width of the outer layer of selected brands of N-95 masks, before and after VHP exposure. e Representative SEM photomicrograph of a N-95 mask’s melt blown layer at 200X and 1000X magnification, pre- and post- 5 cycles of VHP exposure. f Comparison of fiber width of the melt blown layer of selected brands of N-95 masks, pre- and post- VHP exposure [Statistical evaluation done by two-way ANOVA, with Bonferroni post-test]. No significant differences observed due to VHP treatment either in external layer of mask or in the melt blown layer of the N-95 mask. Similarly, there were no discernable changes observed in integrity of coveralls